BiSmart 2.0 is a next-gen blister inspection system that combines speed, accuracy, and simplicity.
Powered by deep learning on the Xsmart architecture, it learns from just 12 perfect blisters and detects defects such as deshapes, embossing flaws, white spots, missing fills, and even stray hairs—without manual setup.
Made in Italy, it’s fully compliant with GAMP 5 and 21 CFR Part 11, delivering intelligent, regulation-ready inspection for modern pharma lines.
Proven performance on even the toughest inspection scenarios—white on white, grey on grey, and transparent capsules in clear PVC.
Key Features
AI-Driven Precision - Deep learning–based, not rule-based.
Real-Time Detection - Identifies invisible defects like deshapes, embossing flaws, missing fills, white spots, and even stray hairs.
Auto-Learning - Ready with just 12 good blisters.
Next-Gen Xsmart Architecture - Optional ultra-high-resolution camera support.
Compliant & Future-Ready - Fully aligned with GAMP 5 and 21 CFR Part 11 standards
Benefits
Cut Downtime : Faster product setup with minimal operator intervention.
Lower Skill Requirement : No manual annotation, labelling, or defect library creation.
Quick Deployment : Fast product training and easy line integration.
Consistent Quality : Higher accuracy, even on complex products like white-on-white or capsules in clear PVC.
Reduced Support Load : Less dependency on technical experts.
Scalable Across Facilities : Easily adaptable for multiple lines and sites.
Email us at marketing@jeksonvision.com or call +919328233954.
